Description
Job Mission
Specify, design, develop, realize, and test subsystems within the limits of system specifications, costs and project planning. Review technical contributions from the team. Structure team contributions. Consolidate technical team identity in communication with other departments. Structure dashboards on technical progress. Define requirements of new functional modules in measurement equipment as well as tests and rolling out this functionality after implementation by SW. Open to travel to customers to operate on-site during one or more weeks at the time.
Job Description
- Wafer metrology in the framework of lithography (overlay measurement) Data analysis and performance analysis for Advanced Metrolgy Package under development
- Performance improvements (technically and usability) of wafer measurements using scatterometry.
- Participate in the definition of subsystem specifications.
- Independently evaluate, select and apply standard engineering techniques, procedures and criteria, using judgment in making minor adaptations and modifications
- Assignments have clear and specified objectives and require the investigation of limited number of variables. Consider other technical areas in devising solutions. It requires developmental experience in a professional position
Education
- MSc or PhD in Physics, Mathematics or any other related Engineering background,
- Experience with data analysis and/or modelling in environments like Matlab.
- Experience with image processing, vision systems, pattern recognition is imaging/vision is a plus.
Experience
Open to graduates
Few years ( 1-3 ) relevant working experience in industry is a plus
Personal skills
- Result oriented attitude; we are looking for an individual that can work towards set deadlines
- Pragmatic approach; you should be capable of thinking in terms of pragmatic solutions
- Pro-active; it is expected from you that you take much initiative
Michael Bailey International is acting as an Employment Business in relation to this vacancy.