Description
For one of our clients we are, on regular basis, looking for a Yieldstar Overlay Measurement Application Engineer.
Introduction:
At the client the sector Development & Engineering is responsible for the specification and the design of the clients products. The Product Group Applications provides integrated solutions with computational, metrology and control technology for extendibility and improved efficiency of lithography products.
Job Mission:
Specify, design, develop, realize, and test subsystems within the limits of system specifications, costs and project planning.
Review technical contributions from the team.
Structure team contributions.
Consolidate technical team identity in communication with other departments.
Structure dashboards on technical progress.
Define requirements of new functional modules in YS as well as tests and rolling out this functionality after implementation by SW.
Open to travel to customers to operate on-site during one or more weeks at the time on a regular basis.
Job Description:
Area's of development:
Wafer metrology in the framework of lithography (overlay measurement)
Performance improvements (technically and usability) of wafer measurements using scatterometry
Cooperate with other disciplines and suppliers to ensure the timely realization of competitive, achievable and serviceable products, including their Product Information Documentation (PID).
Participate in the definition of system specifications. Contribute to the overall broadening and maintenance of the clients technology base.
Independently evaluate, select and apply standard engineering techniques, procedures and criteria, using judgment in making minor adaptations and modifications.
Assignments have clear and specified objectives and require the investigation of limited number of variables. Consider other technical areas in devising solutions. It requires developmental experience in a professional position.
Education:
Master in Physics or Engineering
Established experience in customer interaction and application support. Preferentially in the area of metrology or tuning of semiconductor processes.
Experience:
For this job position the candidate need to have:
3-5 years of experience
Context of the position:
Within D&E Application the group YieldStar applications covers the area of physics and mathematics development required to extract relevant metrics with required performance characteristics from the raw acquisitions, as well as the design, integration and test of new measurement functions enabling the necessary applications on and meeting the usability criteria of the metrology tool. In addition the group is also responsible for the area of reticle marker design, enabling measurement of specific lithographic parameters by means of YieldStar.